In the Group of Solid-State-Spectroscopy of Electronically Correlated Materials we use a novel photoemission technique, Time-of-Flight Momentum Microscopy (ToF-MM), for structural analysis and electronic band structure studies of modern correlated materials. We perform measurements on crystals and thin films in the laboratories and at synchrotron facilities. Our aim is a deep understanding of the reasons for exotic macroscopic properties of the materials by revealing peculiarities in their electronic structure.
