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Structural analysis using hard X-Ray photoelectron diffraction (hXPD)
Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
Band structure studies with angle resolved photoemission spectroscopy (XPS, ARPES)
Chirality and dichroism studies (CDAD/LCD/MCD)
Research equipment
Publications
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Main navigation
Research
Structural analysis using hard X-Ray photoelectron diffraction (hXPD)
Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
Band structure studies with angle resolved photoemission spectroscopy (XPS, ARPES)
Chirality and dichroism studies (CDAD/LCD/MCD)
Research equipment
Publications
Group
News
Open positions
Gallery
Benjamin Helmer
Position:
HiWi Student
