Forschung

Structural analysis using hard X-Ray photoelectron diffraction (hXPD)

Measurements of hXPD with momentum microscopy and hard X-ray excitations at synchrotron facilities.

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Band structure studies with angle resolved photoemission spectroscopy (XPS, ARPES)

Measurements of electronic band structure of the corelated materials with UV, soft X-ray and hard X-ray excitations in the laboratories and synchrotron facilities.

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Chirality and dichroism studies (CDAD/LCD/MCD)

Measurements of magnetic circular dichroism (MCD) and circular/linear dichroism in angular distribution of photoelectrons (CDAD/LDAD) to study chirality in structural and electronical structures; time and inversion symmetry breaking; magnetic ordering of the materials.

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Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)

We perform measurements with a unique setup of transmission time-of-flight momentum microscopy (TToF-MM) that combines two innovative research approaches: transmission inelastic electron scattering and energy loss spectroscopy. Full-field imaging of inelastic electron scattering (IES) provides insight into the dynamic electronic degrees of freedom in topological materials that is not accessible by any other experimental approach.

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