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Structural analysis using hard X-Ray photoelectron diffraction (hXPD)
Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
Band structure studies with angle resolved photoemission spectroscopy (XPS, ARPES)
Chirality and dichroism studies (CDAD/LCD/MCD)
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Structural analysis using hard X-Ray photoelectron diffraction (hXPD)
Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
Band structure studies with angle resolved photoemission spectroscopy (XPS, ARPES)
Chirality and dichroism studies (CDAD/LCD/MCD)
Forschungsausrüstung
Publikationen
Group
Nachrichten
Offene Stellen
Galerie
Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
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Studies of inelastic scattering in thin films with Transmission Time-of-Flight Momentum Microscope (TR-ToF-MM)
